Direct detection in Transmission Electro
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Devis Contarato; Peter Denes; Dionisio Doering; John Joseph; Brad Krieger
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Article
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2011
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Elsevier Science
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English
β 355 KB
This paper presents the characterization of a CMOS monolithic pixel sensor prototype optimized for direct detection in Transmission Electron Microscopy (TEM). The sensor was manufactured in a deepsubmicron commercial CMOS process and features pixels of 5 mm pitch. Different pixel architectures have