CMOS circuit testing via time-resolved luminescence measurements and simulations

✍ Scribed by Stellari, F.; Tosi, A.; Zappa, F.; Cova, S.

• Book ID: 114629510
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 496 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2003.822195