High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements

✍ Scribed by Stellari, F.; Zappa, F.; Cova, S.; Porta, C.; Tsang, J.C.

• Book ID: 114538968
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 97 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.974711