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Cluster projectile ions used for the SIMS analysis of silicon

✍ Scribed by Sh. Akhunov, S. N. Morozov

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Extremely low-energy projectiles for SIM

✍ Kousuke Moritani; Michihiro Hashinokuchi; Jun Nakagawa; Takahiro Kashiwagi; Nori 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 259 KB

SIMS analysis using molecular ions for t

✍ A Chew; DE Sykes 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 312 KB

Factorial analysis of cluster-SIMS depth

✍ Yukio Fujiwara; Kouji Kondou; Kouji Watanabe; Hidehiko Nonaka; Naoaki Saito; Tos 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 335 KB

SIMS system for the analysis of sputtere

✍ Haberland, D.; Harde, P.; Nelkowski, H.; Schlaak, W. 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 314 KB

On the use of the saha-eggert equation f

✍ F.G Rüdenauer; W Steiger; H.W Werner 📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 439 KB

SIMS depth profiling analysis of halogen

✍ O. Koudriavtseva; A. Morales-Acevedo; Yu. Kudriavtsev; S. Gallardo; R. Asomoza; 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 647 KB