✦ LIBER ✦

Circuit behavior modeling and compact testing performance evaluation

✍ Scribed by Yih, J.-S.; Mazumder, P.

Book ID: 119774988
Publisher: IEEE
Year: 1991
Tongue: English
Weight: 465 KB
Volume: 26
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.65712

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