Modeling of IGBT Short-Circuit Behavior
β Scribed by Bliek, A. ;Guerin, J. ;Tholomier, M.
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 177 KB
- Volume
- 194
- Category
- Article
- ISSN
- 0031-8965
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Two extreme configurations under short-circuit conditions leading to the punch through trench IGBT failure under the effect of the temperature and the gate resistance have been studied. By analyzing internal physical parameters, it was highlighted that the elevation of the temperature causes an acce
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