Near surface layers structure data as r, N, a, AEo and known phases and amplitudes as well as thickness were used for the evaluation of X-ray reflection spectra. With these data, the energy dependent index of refraction n = 1 -~ -i/3 for each layer can be calculated. The application of the Fresnel t
β¦ LIBER β¦
ChemInform Abstract: Surface Structure Determinations Using X-Ray Absorption Spectroscopy.
β Scribed by J. HAASE
- Book ID
- 112036854
- Publisher
- John Wiley and Sons
- Year
- 2010
- Weight
- 26 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0931-7597
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