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Structural determination of 99Tc radiopharmaceuticals and compounds using X-ray absorption spectroscopy

✍ Scribed by J. Terry; B. Grzenia; D. Papagiannopoulou; J. Kyger; S. Jurisson; J. D. Robertson

Publisher
Springer
Year
2005
Tongue
English
Weight
543 KB
Volume
263
Category
Article
ISSN
1588-2780

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Near surface layers structure data as r, N, a, AEo and known phases and amplitudes as well as thickness were used for the evaluation of X-ray reflection spectra. With these data, the energy dependent index of refraction n = 1 -~ -i/3 for each layer can be calculated. The application of the Fresnel t