Near surface structure determination using X-ray reflection absorption spectroscopy

✍ Scribed by P. Borthen; H.-H. Strehblow

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 111 KB
• Volume: 208-209
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/0921-4526(94)00859-t

✦ Synopsis

Near surface layers structure data as r, N, a, AEo and known phases and amplitudes as well as thickness were used for the evaluation of X-ray reflection spectra. With these data, the energy dependent index of refraction n = 1 -~ -i/3 for each layer can be calculated. The application of the Fresnel theory to an assumed layer structure yields the reflectivity as a function of the energy. As an example, oxidized copper surface is discussed.