Chemically etched silicon surfaces viewed at the atomic level by force microscopy

✍ Scribed by Kim, Yun; Lieber, Charles M.

• Book ID: 127383846
• Publisher: American Chemical Society
• Year: 1991
• Tongue: English
• Weight: 921 KB
• Volume: 113
• Category: Article
• ISSN: 0002-7863
• DOI: 10.1021/ja00006a079