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Study of the dislocation structure involved in a nanoindentation test by atomic force microscopy and controlled chemical etching

✍ Scribed by Y. Gaillard; C. Tromas; J. Woirgard

Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 250 KB
Volume: 51
Category: Article
ISSN: 1359-6454
DOI: 10.1016/s1359-6454(02)00509-8

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