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Charged Defect Quantification in Pt∕Al2O3∕In0.53Ga0.47As∕InP MOS Capacitors

✍ Scribed by Long, R. D.; Shin, B.; Monaghan, S.; Cherkaoui, K.; Cagnon, J.; Stemmer, S.; McIntyre, P. C.; Hurley, P. K.

Book ID: 118237102
Publisher: The Electrochemical Society
Year: 2011
Tongue: English
Weight: 979 KB
Volume: 158
Category: Article
ISSN: 0013-4651
DOI: 10.1149/1.3545799

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