Charge trapping in dry and wet oxides on N‐type 6H–SiC studied by Fowler–Nordheim charge injection

✍ Scribed by Stein von Kamienski, E. G.; Portheine, F.; Stein, J.; Golz, A.; Kurz, H.

• Book ID: 111901762
• Publisher: American Institute of Physics
• Year: 1996
• Tongue: English
• Weight: 334 KB
• Volume: 79
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.361118