✦ LIBER ✦
Walk-out phenomena in 6H-SiC mesa diodes with SiO2/Si3N4 passivation and charge trapping in dry and wet oxides on N-type 6H-SiC
✍ Scribed by M. Bakowski; U. Gustafsson; Z. Ovuka
- Book ID
- 108362218
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 404 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0026-2714
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