✦ LIBER ✦
Effects of Fowler-Nordheim stress on interface trap density and emission cross sections in n-MOSFETs studied by three-level charge pumping
✍ Scribed by Xiao-jie Yuan; M. Kivi; S. Taylor; P. Hurley
- Book ID
- 126619416
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 321 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0741-3106
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