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Charge transport mechanism in metal-nitride-oxide-silicon structures

✍ Scribed by Nasyrov, K.A.; Gritsenko, V.A.; Kim, M.K.; Chae, H.S.; Chae, S.D.; Ryu, W.I.; Sok, J.H.; Lee, J.-W.; Kim, B.M.


Book ID
121801418
Publisher
IEEE
Year
2002
Tongue
English
Weight
205 KB
Volume
23
Category
Article
ISSN
0741-3106

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