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Charge diffusion measurement in fully depleted CCD using X-rays

✍ Scribed by Kotov, I.V.; Frank, J.; Kotov, A.I.; Kubanek, P.; O'Connor, P.; Radeka, V.; Takacs, P.


Book ID
119333069
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
137 KB
Volume
695
Category
Article
ISSN
0168-9002

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