✦ LIBER ✦

Charge-based testing BIST for embedded memories

✍ Scribed by Alorda, B.; de Paul, I.; Segura, J.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A BIST-based Solution for the Diagnosis

✍ D. Appello; A. Fudoli; V. Tancorre; P. Bernardi; F. Corno; M. Rebaudengo; M. Son 📂 Article 📅 2004 🏛 Springer US 🌐 English ⚖ 133 KB

Test-set embedding based on width compre

✍ Chakrabarty, K.; Das, S.R. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 138 KB

BIST-Based Fault Diagnosis for Read-Only

✍ Mukherjee, N.; Pogiel, A.; Rajski, J.; Tyszer, J. 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 822 KB

Testing and Diagnosis Methodologies for

✍ Jin-Fu Li; Ruey-Shing Tzeng; Cheng-Wen Wu 📂 Article 📅 2003 🏛 Springer US 🌐 English ⚖ 369 KB

An efficient BIST method for non-traditi

✍ Jone, W.-B.; Der-Chen Huang; Das, S.R. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 412 KB

On Using Twisted-Ring Counters for Test

✍ Shivakumar Swaminathan; Krishnendu Chakrabarty 📂 Article 📅 2001 🏛 Springer US 🌐 English ⚖ 420 KB