An efficient BIST method for non-traditional faults of embedded memory arrays

✍ Scribed by Jone, W.-B.; Der-Chen Huang; Das, S.R.

• Book ID: 114629437
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 412 KB
• Volume: 52
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2003.818546