A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques

✍ Scribed by D. Appello; A. Fudoli; V. Tancorre; P. Bernardi; F. Corno; M. Rebaudengo; M. Sonza Reorda

• Book ID: 111589189
• Publisher: Springer US
• Year: 2004
• Tongue: English
• Weight: 133 KB
• Volume: 20
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1023/b:jett.0000009315.57771.94