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Characterization of ZrO2thin films deposited by MOCVD as ceramic coatings

✍ Scribed by A. M. Torres-Huerta; M. A. Domínguez-Crespo; E. Onofre-Bustamante; A. Flores-Vela


Book ID
106397075
Publisher
Springer
Year
2011
Tongue
English
Weight
958 KB
Volume
47
Category
Article
ISSN
0022-2461

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Role of the MOCVD deposition conditions
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High-k ZrO 2 thin films suitable for microelectronics applications were deposited by DLI-MOCVD method on planar Si (1 0 0) and pores etched in Si (1 0 0). The effects of various experimental parameters such as temperature of substrates, injection frequency, concentration of the precursor and oxygen