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Characterization of ultrathin insulating Al[sub 2]O[sub 3] films grown on Nb(110)/sapphire(0001) by tunneling spectroscopy and microscopy

✍ Scribed by Dietrich, Ch.; Boyen, H.-G.; Koslowski, B.

Book ID: 121206114
Publisher: American Institute of Physics
Year: 2003
Tongue: English
Weight: 765 KB
Volume: 94
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1586984

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