𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Characterization of ultrathin InSb nanocrystals film deposited on SiO2/Si substrate

✍ Scribed by Dengyue Li; Hongtao Li; Hehui Sun; Liancheng Zhao


Book ID
115021211
Publisher
Springer-Verlag
Year
2011
Tongue
English
Weight
355 KB
Volume
6
Category
Article
ISSN
1931-7573

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Characterization of silicon carbide thin
✍ P. Zanola; E. Bontempi; C. Ricciardi; G. Barucca; L.E. Depero πŸ“‚ Article πŸ“… 2004 πŸ› Elsevier Science 🌐 English βš– 227 KB

Due to its outstanding electrical and mechanical properties, silicon carbide (SiC) is considered a leading semiconducting material for high temperature sensors. Since the piezoresistive effect in SiC is highly anisotropic and exhibits a dependence on the crystal orientation, the role of the substra