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Structural and noise characterization of VO2films on SiO2/Si substrates

✍ Scribed by M. V. Baidakova; A. V. Bobyl’; V. G. Malyarov; V. V. Tret’yakov; I. A. Khrebtov; I. I. Shaganov

Book ID
110123106
Publisher
SP MAIK Nauka/Interperiodica
Year
1997
Tongue
English
Weight
73 KB
Volume
23
Category
Article
ISSN
1063-7850

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