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Characterization of Ultrathin Dielectric Films With the Prism-Coupler Method

✍ Scribed by Kin Seng Chiang; Sin Yip Cheng; Qing Liu

Book ID: 115372203
Publisher: Optical Society of America
Year: 2007
Tongue: English
Weight: 248 KB
Volume: 25
Category: Article
ISSN: 0733-8724
DOI: 10.1109/JLT.2007.893024

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