✦ LIBER ✦
Accuracy and Applicability of Low-Frequency – Measurement Methods for Characterization of Ultrathin Gate Dielectrics With Large Current
✍ Scribed by Kuroda, R.; Teramoto, A.; Komuro, T.; Tatekawa, H.; Sugawa, S.; Ohmi, T.
- Book ID
- 114618671
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 425 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9383
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