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Characterization of thin films of amorphous GaP using optical and electron spectroscopy

✍ Scribed by J. Pernas; M. Erman; J.B. Theeten; F. Simondet; A. Gheorghiu; M.L. Theye; L. Nevot

Publisher: Elsevier Science
Year: 1981
Tongue: English
Weight: 779 KB
Volume: 82
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(81)90480-6

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