𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Characterization of the microstructure of Co thin film on silicon substrate by TEM

✍ Scribed by Z. L. Zhang; Z. G. Xiao; X. B. Wu; Z. S. Yu

Book ID
107452410
Publisher
Springer US
Year
2000
Tongue
English
Weight
816 KB
Volume
29
Category
Article
ISSN
0361-5235

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

TEM observation on the microstructure of
TEM observation on the microstructure of Co doped C films
✍ Mi, W. B. ;Li, Z. Q. ;Wu, P. ;Jiang, E. Y. ;Bai, H. L. πŸ“‚ Article πŸ“… 2005 πŸ› John Wiley and Sons 🌐 English βš– 525 KB

## Abstract Co doped C films with different Co volume fraction __x__~v~ were fabricated using facing‐target sputtering at room temperature. The as‐deposited films are composed of ∼2 nm amorphous Co granules dispersed in a‐C matrix, and their morphology is composition independent. The graphitized ca