The growth and characterization of zirconium oxide (ZrO 2 ) thin films prepared by thermal oxidation of a deposited Zr metal layer on SiO 2 /Si were investigated. Uniform ZrO 2 thin film with smooth surface morphology was obtained. The thermal ZrO 2 films showed a polycrystalline structure. The diel
Characterization of superconducting thin film growth on silicon substrates
β Scribed by E. Bouteloup; M. Hervieu; B. Mercey; H. Murray; G. Poullain; B. Raveau; T. Rouillon
- Book ID
- 107790107
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 464 KB
- Volume
- 91
- Category
- Article
- ISSN
- 0022-0248
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## Abstract ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 100 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a βFull Textβ option. The original article is trackable v
We have prepared thin films of YBCO on Si (100) and on Si with Ag-buffer layer by DC-magnetron sputtering. Post-deposition annealing at 7173K was necessary in order to obtain superconducting films. The films on silicon have no superconducting transition down to 50k. The films on silicon with Ag-buff