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Characterization of the bulk defects in InP crystal with a high-resolution triple-crystal X-ray diffractometer

✍ Scribed by E. L. Gartstein

Book ID: 112543428
Publisher: Springer
Year: 1992
Tongue: English
Weight: 647 KB
Volume: 88
Category: Article
ISSN: 1434-6036
DOI: 10.1007/bf01470921

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