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High-resolution triple-crystal X-ray diffraction experiments performed at the Australian National Beamline Facility on a silicon sample with lateral periodic superstructure

✍ Scribed by Nikulin, A. Yu. ;Stevenson, A. W. ;Hashizume, H. ;Wilkins, S. W. ;Cookson, D. ;Foran, G. ;Garrett, R. F.


Book ID
114500921
Publisher
International Union of Crystallography
Year
1995
Tongue
English
Weight
864 KB
Volume
28
Category
Article
ISSN
0021-8898

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