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Characterization of Surface-Oxidized Phase in Silicon Nitride and Silicon Oxynitride Powders by X-ray Photoelectron Spectroscopy

✍ Scribed by Kiyoshi Okada; Koyo Fukuyama; Yoshikazu Kameshima

Book ID
110826947
Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
642 KB
Volume
78
Category
Article
ISSN
0002-7820

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