Characterization of single-crystal sapphire substrates by X-ray methods and atomic force microscopy

✍ Scribed by I. A. Prokhorov; B. G. Zakharov; V. E. Asadchikov; A. V. Butashin; B. S. Roshchin; A. L. Tolstikhina; M. L. Zanaveskin; Yu. V. Grishchenko; A. E. Muslimov; I. V. Yakimchuk; Yu. O. Volkov; V. M. Kanevskii; E. O. Tikhonov

• Book ID: 111438540
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2011
• Tongue: English
• Weight: 909 KB
• Volume: 56
• Category: Article
• ISSN: 1063-7745
• DOI: 10.1134/s1063774511030242