✦ LIBER ✦

Characterization of silicon by ion beam techniques

✍ Scribed by P. Siffert

Publisher: Elsevier Science
Year: 1984
Weight: 270 KB
Volume: 8
Category: Article
ISSN: 0146-3535
DOI: 10.1016/0146-3535(84)90069-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of silicon by ion beam

Characterization of silicon by ion beam techniques

📂 Article 📅 1984 🏛 Elsevier Science ⚖ 71 KB

Characterization of silicon by ion beam

Characterization of silicon by ion beam techniques : P. Siffert. Prog. Crystal Growth Charact. 8 (1/2), 3 (1984)

📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 129 KB

Characterization of ion-beam-sputtered t

Characterization of ion-beam-sputtered tungsten films on silicon

✍ Françoise Meyer; Christian Schwebel; Claude Pellet; Guy Gautherin 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 462 KB

Optical properties of thin amorphous sil

Optical properties of thin amorphous silicon and amorphous hydrogenated silicon films produced by ion beam techniques

✍ P.J. Martin; R.P. Netterfield; W.G. Sainty; D.R. McKenzie 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 349 KB

Focused ion beams techniques for nanomat

Focused ion beams techniques for nanomaterials characterization

✍ Richard M. Langford 📂 Article 📅 2006 🏛 John Wiley and Sons 🌐 English ⚖ 483 KB

## Abstract Focused ion beam and dual platform systems have, over the last 10 years, become a main stay of sample preparation for material analysis. In this article the merits of using these systems are discussed and the three main techniques used to prepare cross‐section specimens for transmission

Ion beam analysis techniques and charact

Ion beam analysis techniques and characterization of amorphous hydrogenated GaAs

✍ J.P. Thomas; M. Fallavier; H. Carchano; L. Alimoussa 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 305 KB