✦ LIBER ✦
Characterization of silicon by ion beam techniques : P. Siffert. Prog. Crystal Growth Charact. 8 (1/2), 3 (1984)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 129 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.