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Characterization of Si/Ge[sub x]Si[sub 1âx] structures by micro-Raman imaging

✍ Scribed by Nakashima, S.; Yamamoto, T.; Ogura, A.; Uejima, K.; Yamamoto, T.

Book ID: 120336613
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 602 KB
Volume: 84
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1695443

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