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Characterization of Self-Formed Ti-Rich Interface Layers in Cu(Ti)/Low-kSamples

✍ Scribed by Kazuyuki Kohama; Kazuhiro Ito; Susumu Tsukimoto; Kenichi Mori; Kazuyoshi Maekawa; Masanori Murakami

Publisher: Springer US
Year: 2008
Tongue: English
Weight: 847 KB
Volume: 37
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-008-0482-8

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