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Characterization of rhenium-silicon thin films

✍ Scribed by J. Thomas; Joachim Schumann; Wolfram Pitschke

Book ID: 105896761
Publisher: Springer
Year: 1997
Tongue: English
Weight: 205 KB
Volume: 358
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s002160050419

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