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Characterization of Quaternary Metal Oxide Films by Synchrotron X-ray Fluorescence Microprobe

✍ Scribed by Perry, D. L.; Thompson, A. C.; Russo, R. E.; Mao, X. L.; Chapman, K. L.

Book ID: 115363018
Publisher: Society for Applied Spectroscopy
Year: 1997
Tongue: English
Weight: 142 KB
Volume: 51
Category: Article
ISSN: 0003-7028
DOI: 10.1366/0003702971939749

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