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Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction

✍ Scribed by Senay Yalcin; Recep Avci

Book ID: 108418129
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 516 KB
Volume: 214
Category: Article
ISSN: 0169-4332
DOI: 10.1016/s0169-4332(03)00519-1

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