Characterization of Palladium Nanoparticles by Using X-ray Reflectivity, EXAFS, and Electron Microscopy

✍ Scribed by Sun, Yuan; Frenkel, Anatoly I.; Isseroff, Rebecca; Shonbrun, Cheryl; Forman, Michelle; Shin, Kwanwoo; Koga, Tadanori; White, Henry; Zhang, Lihua; Zhu, Yimei; Rafailovich, Miriam H.; Sokolov, Jonathan C.

• Book ID: 118154205
• Publisher: American Chemical Society
• Year: 2006
• Tongue: English
• Weight: 802 KB
• Volume: 22
• Category: Article
• ISSN: 0743-7463
• DOI: 10.1021/la052686k