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Characterization of oxide trap energy by analysis of the SILC roll-off regime in flash memories

✍ Scribed by Ielmini, D.; Spinelli, A.S.; Visconti, A.

Book ID: 114618070
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 454 KB
Volume: 53
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2005.860658

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