✦ LIBER ✦
Explanation of SILC Probability Density Distributions With Nonuniform Generation of Traps in the Tunnel Oxide of Flash Memory Arrays
✍ Scribed by Vianello, E.; Driussi, F.; Esseni, D.; Selmi, L.; Widdershoven, F.; van Duuren, M.J.
- Book ID
- 114618835
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 333 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9383
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