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Characterization of organic low-dielectric-constant materials using optical spectroscopy

✍ Scribed by Postava, Kamil; Yamaguchi, T.; Nakano, T.

Book ID
115403419
Publisher
Optical Society of America
Year
2001
Tongue
English
Weight
373 KB
Volume
9
Category
Article
ISSN
1094-4087

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## Abstract A method of measurement of the real and imaginary parts of high dielectric constant materials at THz frequencies is described. The method is based on application of double‐layer sample with variable distance between slabs. The recorded power transmittance inerferogram is employed for re