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Characterization of native oxide film on amorphous Co66Si16B12Fe4Mo2 by X-ray photoelectron spectroscopy

✍ Scribed by Rohit Jain; Deepika Bhandari; Anil Dhawan; S.K. Sharma

Book ID: 116605791
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 216 KB
Volume: 490
Category: Article
ISSN: 0925-8388
DOI: 10.1016/j.jallcom.2009.10.119

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