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Characterization of native and heterooxide layers on compound semiconductors by combined use of surface analysis methods

✍ Scribed by U. Kaiser; P. Sander; O. Ganschow; A. Benninghoven

Book ID: 112500148
Publisher: Springer
Year: 1984
Tongue: English
Weight: 554 KB
Volume: 319
Category: Article
ISSN: 1618-2650
DOI: 10.1007/bf01226794

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