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Characterization of MBE-grown Si on (001) GaAs by transmission electron microscopy

✍ Scribed by C.W.T. Bulle-Lieuwma

Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 187 KB
Volume: 19
Category: Article
ISSN: 0304-3991
DOI: 10.1016/0304-3991(86)90016-1

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