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Characterization of layered synthetic microstructure by transmission electron microscopy and diffraction

✍ Scribed by Lepêtre, Yves; Rasigni, Georges

Book ID
115416566
Publisher
Optical Society of America
Year
1984
Tongue
English
Weight
414 KB
Volume
9
Category
Article
ISSN
0146-9592

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✍ M.F. Denanot; J. Rabier 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 407 KB

Aluminium nitride samples sintered with various Y20: concentrations are characterized by transmission electron microscopy. Topology and second phase characteristics at grain boundaries are investigated by X-ray and diffraction experiments. At low Y:O~ concentrations (up to 10%) second phases (mainly