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Characterization of ion species of silicon oxide films using positive and negative secondary ion mass spectra

โœ Scribed by Kiyoshi Chiba; Shun Nakamura


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
298 KB
Volume
253
Category
Article
ISSN
0169-4332

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Quadrupole secondary ion mass spectromet
โœ S. Daolio; B. Facchin; C. Pagura; A. Tolstogouzov; N. Konenkov ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 84 KB ๐Ÿ‘ 2 views

The purpose of this study was to design a quadrupole secondary ion mass spectrometer for simultaneous detection of both positive and negative ions of different mass. An original setup based on a quadrupole electrostatic deflector configuration that allows energy and spatial separation of all types o