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Characterization of interfacial roughness in Co/Cu multilayers by x-ray scattering

✍ Scribed by Gu, T.; Goldman, A. I.; Mao, M.


Book ID
127253408
Publisher
The American Physical Society
Year
1997
Tongue
English
Weight
105 KB
Volume
56
Category
Article
ISSN
1098-0121

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